Prof. Jaisoon Kim
Technical Advisor at Myongji Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (20)

SPIE Journal Paper | September 24, 2018
OE Vol. 57 Issue 09
KEYWORDS: Physics, Optical engineering

SPIE Journal Paper | March 28, 2018
OE Vol. 57 Issue 03
KEYWORDS: Visualization, Optical engineering, 3D displays, Visibility, Cameras, Photography, Visible radiation, LCDs, Image quality, Distance measurement

PROCEEDINGS ARTICLE | March 13, 2018
Proc. SPIE. 10585, Metrology, Inspection, and Process Control for Microlithography XXXII
KEYWORDS: Wafer-level optics, Microscopes, Light emitting diodes, Imaging systems, Inspection, Optical inspection, Near field, Objectives, Semiconducting wafers, Near field optics

PROCEEDINGS ARTICLE | March 28, 2017
Proc. SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI
KEYWORDS: Optical design, Prisms, Light sources, Lithium, Light emitting diodes, Ultraviolet radiation, Inspection, Optical inspection, Near field, Beam shaping, Semiconducting wafers, Near field optics, Defect inspection

PROCEEDINGS ARTICLE | April 2, 2014
Proc. SPIE. 9050, Metrology, Inspection, and Process Control for Microlithography XXVIII
KEYWORDS: Visible radiation, Multilayers, Imaging systems, Electrodes, Organic light emitting diodes, Glasses, Image processing, Ultraviolet radiation, Inspection, Objectives

SPIE Journal Paper | February 1, 2011
OE Vol. 50 Issue 02
KEYWORDS: Charge-coupled devices, Molybdenum, Digital holography, Holography, Holograms, Microscopes, 3D image reconstruction, 3D metrology, Optical engineering, 3D image processing

Showing 5 of 20 publications
Conference Committee Involvement (1)
Optical Design and Testing VIII
11 October 2018 | Beijing, China
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