Prof. Jaisoon Kim
Technical Advisor at Myongji Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (21)

Proceedings Article | 26 March 2019
Proc. SPIE. 10959, Metrology, Inspection, and Process Control for Microlithography XXXIII
KEYWORDS: Microscopes, Titanium, Light emitting diodes, Imaging systems, Sensors, Manufacturing, Inspection, Image resolution, Near field, Objectives

SPIE Journal Paper | 24 September 2018
OE Vol. 57 Issue 09
KEYWORDS: Physics, Optical engineering

SPIE Journal Paper | 28 March 2018
OE Vol. 57 Issue 03
KEYWORDS: Visualization, Optical engineering, 3D displays, Visibility, Cameras, Photography, Visible radiation, LCDs, Image quality, Distance measurement

Proceedings Article | 13 March 2018
Proc. SPIE. 10585, Metrology, Inspection, and Process Control for Microlithography XXXII
KEYWORDS: Wafer-level optics, Microscopes, Light emitting diodes, Imaging systems, Inspection, Optical inspection, Near field, Objectives, Semiconducting wafers, Near field optics

Proceedings Article | 28 March 2017
Proc. SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI
KEYWORDS: Optical design, Prisms, Light sources, Lithium, Light emitting diodes, Ultraviolet radiation, Inspection, Optical inspection, Near field, Beam shaping, Semiconducting wafers, Near field optics, Defect inspection

Showing 5 of 21 publications
Conference Committee Involvement (3)
Optical Design and Testing X
11 October 2020 | Beijing, China
Optical Design and Testing IX
21 October 2019 | Hangzhou, China
Optical Design and Testing VIII
11 October 2018 | Beijing, China
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