Prof. Jakob J. Jütz
Professor at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Microscopes, Holography, Digital holography, Resonators, Lasers, Crystals, Laser resonators, Thermal effects, Laser crystals, Temperature metrology

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