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Dr. Jakub Czajkowski
Postdoctoral research fellow at Optoelectronics and Measurement Techniques Lab
SPIE Involvement:
Author
Area of Expertise:
Interferometry , Imaging , Printed electronics , Optical coherence tomography , Measurement techniques , Material characterization
Websites:
Company Website
Publications (3)
Proceedings Article | 13 September 2012 Paper
Characterization of ink-jet printed RGB color filters with spectral domain optical coherence tomography
Proceedings Volume 8493, 849308 (2012) https://doi.org/10.1117/12.929681
KEYWORDS: Optical coherence tomography, Optical filters, Light sources, Profilometers, Imaging systems, Glasses, RGB color model, Data acquisition, Cameras, Photoresist materials
Proceedings Article | 5 May 2012 Paper
Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics
J. Czajkowski, J. Lauri, R. Sliz, P. Fält, T. Fabritius, R. Myllylä, B. Cense
Proceedings Volume 8430, 84300K (2012) https://doi.org/10.1117/12.922443
KEYWORDS: Optical coherence tomography, Electronics, Inspection, Light sources, Spectroscopy, Signal to noise ratio, Epoxies, Spectral resolution, Antennas, Interferometers
Proceedings Article | 25 November 2010 Paper
Evaluation of microfluidic channels with optical coherence tomography
Proceedings Volume 7376, 737617 (2010) https://doi.org/10.1117/12.871445
KEYWORDS: Microfluidics, Optical coherence tomography, Interfaces, Data processing, Refractive index, Polymers, Image segmentation, Photonic crystal fibers, Light sources, Interferometers
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