Dr. Jalal Jomaah
Associate Professor at IMEP-LAHC
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Oxides, Signal to noise ratio, Dielectrics, Interfaces, Silicon, Doping, Transistors, Field effect transistors, Silicon carbide, Instrument modeling

PROCEEDINGS ARTICLE | May 12, 2003
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Oxides, Silicon, Interference (communication), Silicon films, Transistors, Field effect transistors, CMOS technology, Analog electronics, Molybdenum, Information operations

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