James A. DiBella
System Applications Engineering Manager at ON Semiconductor
SPIE Involvement:
Conference Program Committee | Author
Websites:
Publications (5)

Proceedings Article | 19 February 2013
Proc. SPIE. 8659, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV
KEYWORDS: Cameras, Diffusion, Quantum efficiency, Interference (communication), Amplifiers, Photodiodes, Capacitance, Image sensors, Charge-coupled devices, Ferroelectric LCDs

Proceedings Article | 15 February 2012
Proc. SPIE. 8298, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII
KEYWORDS: Cameras, Sensors, Silicon, Quantum efficiency, Image resolution, Photodiodes, Microlens, Charge-coupled devices, CCD image sensors, Ferroelectric LCDs

Proceedings Article | 15 February 2012
Proc. SPIE. 8298, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII
KEYWORDS: Infrared imaging, Optical filters, Visible radiation, Imaging systems, Cameras, Image processing, Quantum efficiency, Vegetation, Image sensors, Image filtering

Proceedings Article | 26 January 2010
Proc. SPIE. 7536, Sensors, Cameras, and Systems for Industrial/Scientific Applications XI
KEYWORDS: Optical filters, Imaging systems, Cameras, Sensors, Image processing, Quantum efficiency, Image sensors, Charge-coupled devices, Intelligence systems, RGB color model

Proceedings Article | 28 January 2009
Proc. SPIE. 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X
KEYWORDS: Imaging systems, Cameras, Sensors, Electrons, Quantum efficiency, Photodiodes, Image sensors, Charge-coupled devices, CCD image sensors, Product engineering

Conference Committee Involvement (4)
Image Sensors and Imaging Systems 2015
9 February 2015 | San Francisco, California, United States
Image Sensors and Imaging Systems 2014
5 February 2014 | San Francisco, California, United States
Sensors, Cameras, and Systems for Industrial/Scientific Applications XIV
6 February 2013 | Burlingame, California, United States
Sensors, Cameras, and Systems for Industrial/Scientific Applications XIII
25 January 2012 | Burlingame, California, United States
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