Dr. James E. Doane
at Univ of South Carolina
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 17, 2005
Proc. SPIE. 5765, Smart Structures and Materials 2005: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems
KEYWORDS: Sensors, Inspection, Transducers, Structural health monitoring, Aluminum, Epoxies, Semiconducting wafers, Adhesives, Failure analysis, Active sensors

PROCEEDINGS ARTICLE | May 9, 2005
Proc. SPIE. 5770, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring
KEYWORDS: Imaging systems, Sensors, Sensor performance, Digital imaging, Structural health monitoring, Aluminum, System integration, Semiconducting wafers, Active sensors, Environmental sensing

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