Mr. James Methven Dykes
at Simon Fraser Univ
SPIE Involvement:
Author
Publications (13)

PROCEEDINGS ARTICLE | February 14, 2011
Proc. SPIE. 7927, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IV
KEYWORDS: Thin films, Transparency, Optical lithography, Sensors, Argon ion lasers, Objectives, Photomasks, Absorbance, Raster graphics, Feedback control

PROCEEDINGS ARTICLE | September 23, 2009
Proc. SPIE. 7488, Photomask Technology 2009
KEYWORDS: Thin films, Optical filters, Optical lithography, Sensors, Calibration, Sputter deposition, Glasses, Indium, Argon ion lasers, Photomasks

PROCEEDINGS ARTICLE | February 24, 2009
Proc. SPIE. 7201, Laser Applications in Microelectronic and Optoelectronic Manufacturing VII
KEYWORDS: Thin films, Optical filters, Optical lithography, Sensors, Calibration, Sputter deposition, Indium, Photomasks, Bismuth, Tin

PROCEEDINGS ARTICLE | October 17, 2008
Proc. SPIE. 7122, Photomask Technology 2008
KEYWORDS: Thin films, Transparency, Sensors, Calibration, Argon ion lasers, Laser development, Nd:YAG lasers, Objectives, Photomasks, Laser systems engineering

PROCEEDINGS ARTICLE | February 6, 2008
Proc. SPIE. 6883, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics
KEYWORDS: Transparency, Optical lithography, Cameras, Sensors, Calibration, Argon ion lasers, Profilometers, Photomasks, Electro optics, Camera shutters

PROCEEDINGS ARTICLE | November 1, 2007
Proc. SPIE. 6730, Photomask Technology 2007
KEYWORDS: Thin films, Lithography, Transparency, Optical lithography, Sensors, Calibration, Argon ion lasers, Photodiodes, Photomasks, Immersion lithography

Showing 5 of 13 publications
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