James A. Ethridge
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 3 September 2019
Proc. SPIE. 11089, Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVI
KEYWORDS: Metamaterials, Ellipsometry, Data modeling, Polarization, Optical properties, Photonic crystals, Chromium, Scanning electron microscopy, Refraction, Nanorods

Proceedings Article | 5 September 2017
Proc. SPIE. 10402, Earth Observing Systems XXII
KEYWORDS: Mathematical modeling, Data modeling, Polarization, Scattering, Remote sensing, Bidirectional reflectance transmission function, Geometrical optics

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