Dr. James E. Harvey
Senior Optical Engineer at Photon Engineering LLC
SPIE Involvement:
Board of Directors | Membership & Communities Committee | Strategic Planning Committee | Fellow status | Conference Program Committee | Conference Chair | Conference Co-Chair | Track Chair | Author | Editor | Instructor
Publications (89)

PROCEEDINGS ARTICLE | September 17, 2018
Proc. SPIE. 10745, Current Developments in Lens Design and Optical Engineering XIX
KEYWORDS: Diffraction, Point spread functions, Telescopes, Mirrors, Segmented mirrors, Stars, Exoplanets, Image quality, Space telescopes, Optical instrument design

PROCEEDINGS ARTICLE | July 6, 2018
Proc. SPIE. 10698, Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave
KEYWORDS: Diffraction, Point spread functions, Telescopes, Mirrors, Segmented mirrors, Exoplanetary science, Image segmentation, Exoplanets, Image quality, Space telescopes

PROCEEDINGS ARTICLE | July 6, 2018
Proc. SPIE. 10698, Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave
KEYWORDS: Diffraction, Point spread functions, Telescopes, Mirrors, Stars, Image segmentation, Light scattering, Exoplanets, Space telescopes, Diffraction gratings

PROCEEDINGS ARTICLE | July 6, 2018
Proc. SPIE. 10698, Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave
KEYWORDS: Telescopes, Mirrors, Stars, Sensors, Particles, Surface roughness, Exoplanets, Space telescopes, Planets, James Webb Space Telescope

PROCEEDINGS ARTICLE | August 31, 2017
Proc. SPIE. 10375, Current Developments in Lens Design and Optical Engineering XVIII

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Diffraction, Optical transfer functions, Data modeling, Scattering, Error analysis, Light scattering, Laser scattering, Fourier transforms, Image quality, Bidirectional reflectance transmission function

Showing 5 of 89 publications
Conference Committee Involvement (20)
Current Developments in Lens Design and Optical Engineering XX
11 August 2019 | San Diego, California, United States
Current Developments in Lens Design and Optical Engineering XIX
21 August 2018 | San Diego, California, United States
Optical Fabrication, Testing, and Metrology VI
15 May 2018 | Frankfurt, Germany
Current Developments in Lens Design and Optical Engineering XVIII
7 August 2017 | San Diego, California, United States
Current Developments in Lens Design and Optical Engineering XVII
31 August 2016 | San Diego, California, United States
Showing 5 of 20 published special sections
Course Instructor
SC383: Understanding X-Ray Imaging Systems
This course provides a basic understanding of X-ray imaging systems and the fundamental physical mechanisms that limit image quality. A complete engineering systems analysis is presented. The relative effect of these mechanisms upon image quality is discussed for a variety of applications including soft X-ray microscopy, high-energy astrophysics, X-ray microlithography, and X-ray synchrotron beam lines.
SC377: Non-Paraxial Scalar Diffraction Theory: Application to Gratings and Surface Scatter Phenomena
In this short course, a linear systems approach to modeling non-paraxial scalar diffraction theory is developed and shown to be shift-invariant with respect to changes in incident angle only when expressed in terms of the direction cosines of the propagation vectors. It is the diffracted radiance (not intensity or irradiance) that is shift-invariant in direction cosine space. This realization extends the range of parameters over which simple Fourier techniques can be used to make accurate calculations concerning wide-angle diffraction phenomena. Diffraction grating behavior and surface scattering effects are two applications that are not limited to the paraxial region and benefit greatly from this new development.
SC136: Astronomical Optics for Astronomers
After an explanation of astronomical optics from Galileo to the Hubble Space Telescope, the geometrical theory of image formation is reviewed. The image degradation effects of diffraction, geometrical aberrations, and scattering are presented with emphasis on obtaining physical insight while retaining some degree of mathematical rigor. A systems approach to image formation leads to a discussion of various image quality criteria appropriate for different applications. Optical transfer function (OTF) in optical performance analysis is discussed for diffraction-limited situations and optical fabrication and environmental errors. The characteristics of reflective telescope configurations are discussed in detail.
SC570: UV/EUV and X-ray Optics
This course provides a basic understanding of UV/EUV and X-ray optical systems and the fundamental physical mechanisms that limit image quality. A complete systems engineering analysis is presented. The relative effect of these mechanisms upon image quality is discussed for a variety of applications including soft X-ray microscopy, high-energy astrophysics, EUV/X-ray microlithography, and X-ray synchrotron beam lines.
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