Dr. James E. Harvey
Senior Optical Engineer at Photon Engineering LLC
SPIE Involvement:
Board of Directors | Membership & Communities Committee | Strategic Planning Committee | Fellow status | Conference Program Committee | Conference Chair | Conference Co-Chair | Author | Editor | Instructor
Publications (85)

PROCEEDINGS ARTICLE | August 31, 2017
Proc. SPIE. 10375, Current Developments in Lens Design and Optical Engineering XVIII

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Bidirectional reflectance transmission function, Scattering, Polarization, Reflectivity, Surface roughness, Light scattering, Rayleigh scattering, Spatial frequencies, Fourier transforms, Inverse scattering problem

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Scattering, Bidirectional reflectance transmission function, Data modeling, Light scattering, Optical transfer functions, Image quality, Diffraction, Laser scattering, Fourier transforms, Error analysis

SPIE Journal Paper | March 23, 2015
OE Vol. 54 Issue 03
KEYWORDS: Ray tracing, Gaussian beams, Wave propagation, Geometrical optics, Superposition, Beam propagation method, Diffraction, Spherical lenses, Systems modeling, Optical engineering

PROCEEDINGS ARTICLE | December 17, 2014
Proc. SPIE. 9293, International Optical Design Conference 2014
KEYWORDS: Image quality, Optical fabrication, Metrology, Scattering, Spatial frequencies, Bidirectional reflectance transmission function, Point spread functions, Optical design, Modulation transfer functions, Fourier transforms

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9205, Reflection, Scattering, and Diffraction from Surfaces IV
KEYWORDS: Scattering, Data modeling, Light scattering, Systems modeling, Bidirectional reflectance transmission function, Scatter measurement, Stray light, Rayleigh scattering, Diffraction, Statistical modeling

Showing 5 of 85 publications
Conference Committee Involvement (19)
Current Developments in Lens Design and Optical Engineering XIX
19 August 2018 | San Diego, California, United States
Optical Fabrication, Testing, and Metrology VI
14 May 2018 | Frankfurt, Germany
Current Developments in Lens Design and Optical Engineering XVIII
7 August 2017 | San Diego, California, United States
Current Developments in Lens Design and Optical Engineering XVII
31 August 2016 | San Diego, California, United States
Optical Fabrication, Testing, and Metrology V
7 September 2015 | Jena, Germany
Showing 5 of 19 published special sections
Course Instructor
SC383: Understanding X-Ray Imaging Systems
This course provides a basic understanding of X-ray imaging systems and the fundamental physical mechanisms that limit image quality. A complete engineering systems analysis is presented. The relative effect of these mechanisms upon image quality is discussed for a variety of applications including soft X-ray microscopy, high-energy astrophysics, X-ray microlithography, and X-ray synchrotron beam lines.
SC377: Non-Paraxial Scalar Diffraction Theory: Application to Gratings and Surface Scatter Phenomena
In this short course, a linear systems approach to modeling non-paraxial scalar diffraction theory is developed and shown to be shift-invariant with respect to changes in incident angle only when expressed in terms of the direction cosines of the propagation vectors. It is the diffracted radiance (not intensity or irradiance) that is shift-invariant in direction cosine space. This realization extends the range of parameters over which simple Fourier techniques can be used to make accurate calculations concerning wide-angle diffraction phenomena. Diffraction grating behavior and surface scattering effects are two applications that are not limited to the paraxial region and benefit greatly from this new development.
SC136: Astronomical Optics for Astronomers
After an explanation of astronomical optics from Galileo to the Hubble Space Telescope, the geometrical theory of image formation is reviewed. The image degradation effects of diffraction, geometrical aberrations, and scattering are presented with emphasis on obtaining physical insight while retaining some degree of mathematical rigor. A systems approach to image formation leads to a discussion of various image quality criteria appropriate for different applications. Optical transfer function (OTF) in optical performance analysis is discussed for diffraction-limited situations and optical fabrication and environmental errors. The characteristics of reflective telescope configurations are discussed in detail.
SC570: UV/EUV and X-ray Optics
This course provides a basic understanding of UV/EUV and X-ray optical systems and the fundamental physical mechanisms that limit image quality. A complete systems engineering analysis is presented. The relative effect of these mechanisms upon image quality is discussed for a variety of applications including soft X-ray microscopy, high-energy astrophysics, EUV/X-ray microlithography, and X-ray synchrotron beam lines.
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top