Mr. James D. Jordan Profile

James D. Jordan

Manager WW Yield Enhancement Svs at Siemens EDA

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Publications (2)

Proceedings Article | 28 August 2003 Paper

Bridging nanometer design-to-manufacturing gap: automated design rules correction and silicon verification

Linard Karklin, Micha Oren, Dragos Dudau, James Jordan

Proceedings Volume 5130, (2003) https://doi.org/10.1117/12.504251

KEYWORDS: Lithography, Silicon, Manufacturing, Photomasks, Product engineering, Semiconducting wafers, Semiconductors, Transistors, Field programmable gate arrays, System on a chip

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Proceedings Article | 10 July 2003 Paper

Design-to-process integration: optimizing 130-nm X architecture manufacturing

Robert Dean, Vinod Malhotra, Nahid King, Michael Sanie, Susan MacDonald, James Jordan, Shigeru Hirukawa

Proceedings Volume 5042, (2003) https://doi.org/10.1117/12.485258

KEYWORDS: Optical proximity correction, Photomasks, Reticles, Manufacturing, Inspection, Metals, Semiconducting wafers, Lithography, Silicon, Critical dimension metrology

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