James Kircher
Staff Optical Engineer
SPIE Involvement:
Author
Publications (18)

Proceedings Article | 4 August 2004
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Semiconductors, Thermography, Infrared imaging, Visible radiation, Germanium, Silicon, Projection systems, Infrared radiation, Infrared signatures, Absorption

Proceedings Article | 31 August 2001
Proc. SPIE. 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
KEYWORDS: Long wavelength infrared, Optical fibers, Mid-IR, Chalcogenide glass, Glasses, Ions, Infrared radiation, Terbium, Analytical research, Prototyping

Proceedings Article | 31 August 2001
Proc. SPIE. 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
KEYWORDS: Nonuniformity corrections, Mid-IR, Cameras, Calibration, Projection systems, Field effect transistors, Resistors, Radiometric resolution, Cryogenics, Temperature metrology

Proceedings Article | 12 July 2000
Proc. SPIE. 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
KEYWORDS: Nonuniformity corrections, Thermography, Infrared imaging, Mid-IR, Transform theory, Projection systems, Infrared radiation, Commercial off the shelf technology, Temperature metrology, RGB color model

Proceedings Article | 12 July 2000
Proc. SPIE. 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
KEYWORDS: Staring arrays, Imaging systems, Cameras, Sensors, Calibration, Control systems, Projection systems, Infrared radiation, Cryogenics, Temperature metrology

Proceedings Article | 12 July 2000
Proc. SPIE. 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
KEYWORDS: Infrared cameras, Mid-IR, Electronics, Capacitors, Cameras, Annealing, Projection systems, Field effect transistors, Raster graphics, Semiconducting wafers

Showing 5 of 18 publications
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