Dr. James E. Millerd
President at 4D Technology Corp
SPIE Involvement:
Conference Program Committee | Author
Websites:
Publications (29)

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10567, International Conference on Space Optics — ICSO 2006
KEYWORDS: Mirrors, Polarization, Interferometers, Interferometry, Polarizers, Phase interferometry, Optical testing, Turbulence, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical components, Telescopes, Metrology, Polarization, Interferometers, Interferometry, Optical testing, Space telescopes, Astronomical imaging

PROCEEDINGS ARTICLE | May 21, 2014
Proc. SPIE. 9099, Polarization: Measurement, Analysis, and Remote Sensing XI
KEYWORDS: Polarization, Birefringence, Imaging systems, Cameras, Sensors, Glasses, Polarizers, Wave plates, Polarimetry, Spatial resolution

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV
KEYWORDS: Beam splitters, Polarization, Interferometers, Sensors, Surface roughness, Profilometers, Phase measurement, Optical mounts, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | September 27, 2011
Proc. SPIE. 8126, Optical Manufacturing and Testing IX
KEYWORDS: Beam splitters, Polarization, Interferometers, Sensors, Surface roughness, Profilometers, Phase measurement, Optical mounts, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | September 10, 2011
Proc. SPIE. 8160, Polarization Science and Remote Sensing V
KEYWORDS: Polarization, Imaging systems, Interferometers, Cameras, Sensors, Interferometry, Wavefronts, Polarizers, Polarimetry, Phase measurement

Showing 5 of 29 publications
Conference Committee Involvement (1)
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top