Dr. James E. Millerd
at 4D Technology Corp
SPIE Involvement:
Publications (30)

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11490, Interferometry XX
KEYWORDS: Telescopes, Mirrors, Polarization, Interferometers, Cameras, Interferometry, Wavefronts, Phase measurement, James Webb Space Telescope

Proceedings Article | 21 November 2017 Paper
Proc. SPIE. 10567, International Conference on Space Optics — ICSO 2006
KEYWORDS: Mirrors, Polarization, Interferometers, Interferometry, Polarizers, Phase interferometry, Optical testing, Turbulence, Phase measurement, Phase shifts

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical components, Telescopes, Metrology, Polarization, Interferometers, Interferometry, Optical testing, Space telescopes, Astronomical imaging

Proceedings Article | 21 May 2014 Paper
Proc. SPIE. 9099, Polarization: Measurement, Analysis, and Remote Sensing XI
KEYWORDS: Polarization, Birefringence, Imaging systems, Cameras, Sensors, Glasses, Polarizers, Wave plates, Polarimetry, Spatial resolution

Proceedings Article | 15 October 2012 Paper
Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV
KEYWORDS: Beam splitters, Polarization, Interferometers, Sensors, Surface roughness, Profilometers, Phase measurement, Optical mounts, Optics manufacturing, Surface finishing

Showing 5 of 30 publications
Conference Committee Involvement (1)
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
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