Dr. James Mure-Dubois
Research Scientist at Zürcher Hochschule für Angewandte Wissenschaften
SPIE Involvement:
Author
Area of Expertise:
3D vision , 3D image processing , range image registration , time-of-flight cameras , microvision , scattering compensation
Publications (5)

PROCEEDINGS ARTICLE | August 29, 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Microscopes, Safety, Imaging systems, Cameras, Sensors, Inspection, Clouds, Range imaging, Time of flight cameras, 3D image processing

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 7000, Optical and Digital Image Processing
KEYWORDS: Microlens array, Defect detection, Lenses, Databases, Metals, Image segmentation, Image processing, Coating, Inspection, Microlens

PROCEEDINGS ARTICLE | October 10, 2007
Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V
KEYWORDS: Point spread functions, Scattering, Cameras, Image processing, Light scattering, Time of flight cameras, Image filtering, Deconvolution, Electronic filtering, Scattering compensation

PROCEEDINGS ARTICLE | October 13, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: 3D acquisition, Three dimensional sensing, Imaging systems, Cameras, Sensors, Video, Interferometry, Range imaging, 3D vision, 3D image processing

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: Microscopes, Imaging systems, Cameras, Sensors, Image processing, Image resolution, 3D metrology, Embedded systems, 3D vision, Miniature imaging systems

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