James L. Zunino
Factor IV Materials Engineer at US Army ARDEC
SPIE Involvement:
Conference Co-Chair | Conference Program Committee | Author
Publications (14)

PROCEEDINGS ARTICLE | March 31, 2010
Proc. SPIE. 7646, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2010
KEYWORDS: Microscopes, Digital photography, Polymers, Optical coatings, Colorimetry, Personal digital assistants, Zinc oxide, Densitometry, Zirconium dioxide, Temperature metrology

PROCEEDINGS ARTICLE | February 19, 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Microelectromechanical systems, Weapons, Safety, Data modeling, Visualization, Reliability, Humidity, Failure analysis, Standards development, Instrument modeling

PROCEEDINGS ARTICLE | February 18, 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Microelectromechanical systems, Microscopes, Fringe analysis, Switches, Reliability, Nondestructive evaluation, CCD cameras, Optoelectronics, Finite element methods, Fused deposition modeling

PROCEEDINGS ARTICLE | February 18, 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Capacitors, Silica, Sensors, Etching, Metals, Silicon, Silicon films, Low pressure chemical vapor deposition, Plasma enhanced chemical vapor deposition, Reactive ion etching

Showing 5 of 14 publications
Conference Committee Involvement (4)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
28 January 2009 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
21 January 2008 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
23 January 2007 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
25 January 2006 | San Jose, California, United States
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