Jan Beneke
at Institut für Technische Optik
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Optical fibers, Step index fibers, Microscopes, Refractive index, Optical properties, Sensors, Free space, Colorimetry, Phase retrieval, Reconstruction algorithms

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