Dr. Jan Burke
Group Leader, Image-based Measurement Systems at Fraunhofer IOSB
SPIE Involvement:
Conference Chair | Conference Program Committee | Conference Co-Chair | Author | Editor
Area of Expertise:
interferometry , phase shifting , precision calibrations , speckle interferometry , fringe analysis
Websites:
Profile Summary

Jan Burke received his Ph.D. from the university of Oldenburg, Germany, in 2000, with a thesis on "Application and Optimisation of the Spatial Phase Shifting Technique in Digital Speckle Interferometry". He then spent a year with MetroLaser Inc., Irvine, CA, where he worked on diverse research projects in optical metrology, such as laser vibrometry, digital holography, and phase-shifting fringe projection. In 2002 he joined the metrology team at the Australian Centre for Precision Optics (ACPO) at the Commonwealth Scientific and Industrial Research Organisation (CSIRO), Sydney, Australia, as a Senior Research Scientist. His current research activities include the development of new methods for phase-shifting interferometry, phase-map stitching, sphere and asphere metrology, three-flat testing, and various other characterisation issues in precision optics.
Publications (25)

Proceedings Article | 16 August 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI

SPIE Conference Volume | 29 October 2018

Proceedings Article | 26 June 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Fringe analysis, Modulation, Reflection, Image processing, Interferometry, Optical metrology, Deflectometry, Phase measurement, Phase shifts, Structured light

SPIE Conference Volume | 1 September 2016

Proceedings Article | 17 July 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Light sources, Light emitting diodes, Spatial frequencies, Cameras, Calibration, Interferometry, Optical metrology, Deflectometry, Laser metrology, Laser optics

Showing 5 of 25 publications
Conference Committee Involvement (10)
Interferometry XX
23 August 2020 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Interferometry XIX
21 August 2018 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Showing 5 of 10 Conference Committees
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