Dr. Jan Dziewior
at Max-Planck-Institut für Quantenoptik
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2020 Presentation + Paper
Proc. SPIE. 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
KEYWORDS: Metrology, Lithium, Super resolution, Photon polarization, Polarization, Sensors, Particles, Single photon, Physics, Quantum mechanics

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