Dr. Jan Garrevoet
at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Publications (7)

Proceedings Article | 6 October 2023 Presentation
Proceedings Volume PC12698, PC1269805 (2023) https://doi.org/10.1117/12.2675485
KEYWORDS: X-rays, X-ray imaging, Partial coherence, Signal detection, Optics manufacturing, Lithographic illumination, Lens arrays, Image restoration, Additive manufacturing, Time metrology

Proceedings Article | 4 October 2022 Presentation + Paper
Christian Schroer, Frank Seiboth, Andreas Schropp, Silvio Achilles, Martin Seyrich, Svenja Patjens, Micheal Stuckelberger, Jan Garrevoet, Vanessa Galbierz, Gerald Falkenberg, Adam Kubec, Christian David, Sven Niese, Peter Gawlitza
Proceedings Volume 12240, 122400J (2022) https://doi.org/10.1117/12.2633458
KEYWORDS: Wave propagation, Wavefronts, X-rays, Beam shaping, Beam propagation method, X-ray optics, Aberration correction, Phase shifts, Synchrotron radiation

Proceedings Article | 9 September 2019 Presentation + Paper
Christian Schroer, Martin Seyrich, Andreas Schropp, Ralph Döhrmann, Stephan Botta, Patrik Wiljes, Dennis Brückner, Maik Kahnt, Felix Wittwer, Lukas Grote, Dorota Koziej, Jan Garrevoet, Gerald Falkenberg
Proceedings Volume 11112, 111120D (2019) https://doi.org/10.1117/12.2529096
KEYWORDS: Sensors, Microscopes, Signal detection, Laser scattering, Scanners, Nitrogen

Proceedings Article | 9 September 2019 Presentation + Paper
Andreas Schropp, Dennis Brückner, Jessica Bulda, Gerald Falkenberg, Jan Garrevoet, Johannes Hagemann, Frank Seiboth, Kathryn Spiers, Frieder Koch, Christian David, Marianna Gambino, Martin Veselý, Florian Meirer, Christian Schroer
Proceedings Volume 11112, 1111208 (2019) https://doi.org/10.1117/12.2528422
KEYWORDS: Beryllium, X-rays, X-ray microscopy, Microscopy, X-ray optics, Tomography, Hard x-rays, Spatial resolution, Lenses

Proceedings Article | 7 September 2017 Paper
Christian Schroer, Martin Seyrich, Maik Kahnt, Stephan Botta, Ralph Döhrmann, Gerald Falkenberg, Jan Garrevoet, Mikhail Lyubomirskiy, Maria Scholz, Andreas Schropp, Felix Wittwer
Proceedings Volume 10389, 103890E (2017) https://doi.org/10.1117/12.2273710
KEYWORDS: X-rays, Microscopes, Sensors, X-ray microscopy, X-ray optics, Laser scattering, Scattering, X-ray diffraction, X-ray imaging, Tomography

Showing 5 of 7 publications
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