Dr. Jan Garrevoet
at Deutsches Elektronen Synchrotron DESY
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microscopes, Sensors, Scanners, Nitrogen, Laser scattering, Signal detection

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: X-ray optics, Lenses, Microscopy, X-rays, X-ray microscopy, Tomography, Spatial resolution, Beryllium, Hard x-rays

Proceedings Article | 7 September 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Microscopes, X-ray optics, Scattering, Sensors, X-rays, X-ray diffraction, X-ray microscopy, Laser scattering, Tomography, X-ray imaging

Proceedings Article | 23 August 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Aberration correction, X-ray optics, Femtosecond phenomena, Glasses, X-rays, X-ray diffraction, Reflectivity, Wavefront aberrations, Wavefront compensation, Optical testing, Wavefront analysis, Synchrotron radiation, Wavefront reconstruction, X-ray characterization

Proceedings Article | 15 September 2016
Proc. SPIE. 9963, Advances in X-Ray/EUV Optics and Components XI
KEYWORDS: Monochromatic aberrations, Visible radiation, X-ray optics, X-rays, Wavefronts, Zernike polynomials, Spherical lenses, Beryllium, Optics manufacturing, Electroluminescent displays

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