Jan O. Gaudestad
VP of Business Development
SPIE Involvement:
Publications (19)

Proceedings Article | 11 March 2024 Presentation + Paper
Proceedings Volume 12893, 128930E (2024) https://doi.org/10.1117/12.2692506
KEYWORDS: Semiconducting wafers, Silicon, Cameras, Photovoltaics, Mirrors, Wavefronts, Reflection, Data acquisition, Calibration, Phase imaging

Proceedings Article | 21 November 2023 Presentation + Paper
Jan Gaudestad, Kiril Ivanov Kurteva, Juan Trujillo-Sevilla, Leon van Dijk, Ronald Otten, Guillermo Castro Luis, Richard van Haren
Proceedings Volume 12750, 127500H (2023) https://doi.org/10.1117/12.2687605
KEYWORDS: Semiconducting wafers, Optical alignment, Silicon, Alignment modeling, Data acquisition, Coating stress, Wavefronts, Wafer-level optics, Scanners, Optical parametric oscillators

Proceedings Article | 5 October 2023 Paper
Proceedings Volume 12802, 128020C (2023) https://doi.org/10.1117/12.2675624
KEYWORDS: Semiconducting wafers, Silicon, Data acquisition, Reflection, Wavefronts, Metals, Image sensors, Cameras, Wafer-level optics, Collimation

Proceedings Article | 28 September 2023 Presentation + Paper
Proceedings Volume 12665, 126650A (2023) https://doi.org/10.1117/12.2678349
KEYWORDS: Semiconducting wafers, Silicon, Data acquisition, Reflection, Wavefronts, Image sensors, Cameras, Wafer-level optics, Photovoltaics, Metrology

Proceedings Article | 15 August 2023 Poster + Paper
Proceedings Volume 12618, 126182X (2023) https://doi.org/10.1117/12.2674201
KEYWORDS: Semiconducting wafers, Silicon, Wavefronts, Reflection, Cameras, Image sensors, Collimation, Photovoltaics, Data acquisition, Wafer testing

Showing 5 of 19 publications
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