Jan Matrisch
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Phase retrieval, Free space, Microscopes, Refractive index, Optical properties, Reconstruction algorithms, Colorimetry, Sensors, Optical fibers, Step index fibers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top