Jan Niehues
PH.D. student at Univ Kassel
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Microscopes, Diffraction, Imaging systems, Interferometers, Image resolution, Interferometry, Linear filtering, Objectives, Modulation transfer functions, Optics manufacturing

PROCEEDINGS ARTICLE | May 5, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Confocal microscopy, Microscopes, Diffraction, Mirrors, Imaging systems, Interferometers, Interferometry, Objectives, Digital micromirror devices, Diffraction gratings

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Chromatic aberrations, Mirrors, Beam splitters, Reflection, Interferometers, Reflectivity, Pellicles, Objectives, Geometrical optics, Neodymium

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Confocal microscopy, Near ultraviolet, Light emitting diodes, Modulation, Interferometers, Microscopy, Silicon, Interferometry, 3D metrology, Objectives

PROCEEDINGS ARTICLE | August 3, 2010
Proc. SPIE. 7790, Interferometry XV: Techniques and Analysis
KEYWORDS: Actuators, Confocal microscopy, Fiber optics, Sensors, Crystals, Interferometry, Fiber optics sensors, Head, Signal processing, Distance measurement

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Actuators, Confocal microscopy, Reflection, Interferometers, Sensors, Interferometry, Fiber optics sensors, Distance measurement, Diodes, Geometrical optics

Showing 5 of 7 publications
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