Jan Seidel
at TU Dresden
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | July 21, 2004
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Near field optics, Interfaces, Dielectrics, Thin films, Molecules, Atomic force microscopy, Surface plasmons, Metals, Electrodes, Dielectric polarization

PROCEEDINGS ARTICLE | August 8, 2003
Proc. SPIE. 5122, Advanced Organic and Inorganic Optical Materials
KEYWORDS: Chromium, Near field scanning optical microscopy, Electrodes, Optical coatings, Electro optics, Transmittance, Microscopy, Near field optics, Optical microscopy, Flat glass

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