Jan Seidel
at TU Dresden
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | July 21, 2004
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Thin films, Surface plasmons, Electrodes, Metals, Molecules, Dielectrics, Interfaces, Atomic force microscopy, Dielectric polarization, Near field optics

PROCEEDINGS ARTICLE | August 8, 2003
Proc. SPIE. 5122, Advanced Organic and Inorganic Optical Materials
KEYWORDS: Electrodes, Microscopy, Optical microscopy, Optical coatings, Chromium, Near field scanning optical microscopy, Transmittance, Flat glass, Electro optics, Near field optics

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