Dr. Jan Vanda
Sr Researcher at Institute of Physics of the ASCR vvi
SPIE Involvement:
Author
Area of Expertise:
optical fibers , laser damage , photonics
Profile Summary

Jan VANDA was born in Czech Republic. He received his Ph.D. from VSB-TU Ostrava in 2009 at the department of telecommunications in the field of optoelectronics. After short experience in industry as quality manager, he joined for one year FORTH-IESL as a post-doc in the Marie-Curie program. Post-doc programme was followed several months position in the area of developing printed Fresnel lenses and one-year experience in Czech Office of Standards Metrology and Testing as national secretary in IEC. Since 2011, he is working as a researcher at Institute of Physics, ASCR, in the HiLASE project. His research interests include fiber optics, photonics, lasers and laser induced damage threshold.
Publications (11)

PROCEEDINGS ARTICLE | November 13, 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Mid-IR, Mirrors, Laser induced damage, Silver, Reflectivity, Wavelength tuning, Laser damage threshold

PROCEEDINGS ARTICLE | November 13, 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Mirrors, Silica, Metals, Dielectrics, Ions, Silver, Coating, Laser applications, Laser damage threshold

PROCEEDINGS ARTICLE | December 6, 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Optical fibers, Mirrors, Polishing, Optical amplifiers, Silica, Laser induced damage, Laser applications, Fiber lasers, Laser damage threshold, Pulsed laser operation

PROCEEDINGS ARTICLE | December 6, 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Mirrors, Silica, Metals, Glasses, Dielectrics, Silver, Coating, Manufacturing, Laser damage threshold, Tantalum

PROCEEDINGS ARTICLE | February 3, 2015
Proc. SPIE. 9255, XX International Symposium on High-Power Laser Systems and Applications 2014
KEYWORDS: Optical amplifiers, Oscillators, Laser applications, Laser development, Amplifiers, Head, Diodes, Picosecond phenomena, Pulsed laser operation, Laser systems engineering

PROCEEDINGS ARTICLE | January 7, 2015
Proc. SPIE. 9442, Optics and Measurement Conference 2014
KEYWORDS: Cameras, Laser induced damage, Reliability, Laser development, Amplifiers, Damage detection, Laser damage threshold, Pulsed laser operation, Standards development, Laser systems engineering

Showing 5 of 11 publications
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