Dr. Jan Vanda
Sr Researcher at HiLASE Ctr
SPIE Involvement:
Area of Expertise:
optical fibers , laser damage , photonics
Profile Summary

Jan VANDA was born in Czech Republic. He received his Ph.D. from VSB-TU Ostrava in 2009 at the department of telecommunications in the field of optoelectronics. After experience in industry, where he worked as quality manager, he joined for one year FORTH-IESL as a post-doc in the Marie-Curie program. Post-doc programme was followed several months position in the area of developing printed Fresnel lenses and one-year experience in Czech Office of Standards Metrology and Testing as national secretary in IEC/CENELEC. Since 2011, he is working at the HiLASE Centre, Institute of Physics of CAS, currently at the position of the senior researcher and the head of LIDT laboratory. His research interests include fiber optics and optical mircostructures, laser processing and laser induced damage threshold.
Publications (24)

Proceedings Article | 24 November 2023 Presentation + Paper
Proceedings Volume 12726, 127260H (2023) https://doi.org/10.1117/12.2686177
KEYWORDS: Laser damage threshold, Beam diameter, Laser optics, Silicon, Laser systems engineering, Laser beam diagnostics, Laser induced damage, Optical testing, Optical components

Proceedings Article | 24 November 2023 Presentation + Paper
Proceedings Volume 12726, 127260B (2023) https://doi.org/10.1117/12.2686252
KEYWORDS: Laser induced damage, Ultrafast phenomena, Windows, Laser damage threshold, Antireflective coatings, Ultraviolet radiation, Laser applications, High power lasers, Laser safety, Contamination

Proceedings Article | 9 December 2022 Poster + Presentation + Paper
Proceedings Volume 12300, 123000L (2022) https://doi.org/10.1117/12.2642773
KEYWORDS: Structured optical fibers, Transmission electron microscopy, Laser systems engineering, Telescopes, Picosecond phenomena, Collimators, Mirrors, Breadboards, Beam divergence, Beam diameter

Proceedings Article | 2 December 2022 Poster + Presentation + Paper
Proceedings Volume 12300, 123000N (2022) https://doi.org/10.1117/12.2642743
KEYWORDS: Laser ablation, Picosecond phenomena, Process control, Laser damage threshold, Thin films, Plasma, Laser development, Signal processing, Resistance, Polarizers

Proceedings Article | 2 December 2022 Presentation + Paper
Proceedings Volume 12300, 1230003 (2022) https://doi.org/10.1117/12.2642866
KEYWORDS: Glasses, Etching, Wet etching, Ultraviolet radiation, Picosecond phenomena, Packaging, Microelectronics, Laser sources, Axicons

Showing 5 of 24 publications
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