Dr. Jana Jágerská
at UiT Arctic Univ of Norway
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

Proceedings Article | 5 March 2019 Presentation
Proc. SPIE. 10914, Optical Components and Materials XVI
KEYWORDS: Wafer-level optics, Mid-IR, Environmental monitoring, Safety, Point-of-care devices, Waveguides, Spectroscopy, Diagnostics, Wave sensors, Molecular spectroscopy

Conference Committee Involvement (2)
Integrated Optics: Devices, Materials, and Technologies XXVI
22 January 2022 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XXV
6 March 2021 | Online Only, California, United States
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