Jared D. Stack
Principal Optical Engineer at Broadcom Inc
SPIE Involvement:
Publications (17)

Proceedings Article | 13 June 2023 Presentation + Paper
Paolo Batoni, Jared Stack, Jeff Gardner, Kevin Welch, Richard Jones, John Childers
Proceedings Volume 12540, 1254004 (2023) https://doi.org/10.1117/12.2663405
KEYWORDS: Diffractive optical elements, LIDAR, Silica, Micro optics, Calibration, Diffraction gratings, Optics manufacturing, Diffraction, Optical calibration

SPIE Journal Paper | 14 December 2022
Horst Schreiber, Xavier LaFosse, Jay J. Zhang, Paolo Batoni, Jared Stack, Jeff Gardner
OE, Vol. 62, Issue 03, 031206, (December 2022) https://doi.org/10.1117/12.10.1117/1.OE.62.3.031206
KEYWORDS: Diffractive optical elements, Calibration, LIDAR, Manufacturing, Silica, Materials processing, Projection systems, Etching, Diffraction gratings, Diffraction

Proceedings Article | 4 March 2010 Paper
James Carriere, Jared Stack, John Childers, Kevin Welch, Marc Himel
Proceedings Volume 7640, 764025 (2010) https://doi.org/10.1117/12.846619
KEYWORDS: Diffractive optical elements, Source mask optimization, Performance modeling, Stray light, Lithography, Lithographic illumination, Manufacturing, Scanners, Ions, Speckle

Proceedings Article | 16 March 2009 Paper
Proceedings Volume 7274, 72740B (2009) https://doi.org/10.1117/12.814215
KEYWORDS: Diffractive optical elements, Photomasks, Manufacturing, Nanoimprint lithography, Source mask optimization, SRAF, Lithographic illumination, Model-based design, Image processing, Lithium

Proceedings Article | 7 March 2008 Paper
Proceedings Volume 6924, 69242O (2008) https://doi.org/10.1117/12.774666
KEYWORDS: Diffractive optical elements, Diffusers, Lithography, Lithographic illumination, Critical dimension metrology, Optics manufacturing, Semiconductors, Photomasks, Custom fabrication, Etching

Showing 5 of 17 publications
Conference Committee Involvement (1)
OPTO Southeast
18 September 2000 | Charlotte, United States
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