Jared Wheeler
at 4D Technology Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 March 2021 Open Access Presentation
Proceedings Volume 11716, 1171601 (2021) https://doi.org/10.1117/12.2595941

Proceedings Article | 3 September 2019 Presentation + Paper
Proceedings Volume 11102, 1110212 (2019) https://doi.org/10.1117/12.2530693
KEYWORDS: 3D metrology, Structured light, Cameras, Fringe analysis, Polarization, Imaging systems, Polarizers, Interferometry, Visualization, Projection systems

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