Jared Wheeler
at 4D Technology Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 March 2021 Presentation
Proc. SPIE. 11716, SPIE Exhibition Product Demonstrations

Proceedings Article | 3 September 2019 Presentation + Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Fringe analysis, Polarization, Visualization, Imaging systems, Cameras, Interferometry, Polarizers, 3D metrology, Projection systems, Structured light

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