Dr. Jaroslav Cihelka
at Institute of Physics of the ASCR vvi
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 19 May 2011
Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III
KEYWORDS: Ultrafast phenomena, Polymethylmethacrylate, Chemical species, Polymers, Molecules, Heat treatments, Solids, Extreme ultraviolet, Free electron lasers, Absorption

Proceedings Article | 29 September 2009
Proc. SPIE. 7451, Soft X-Ray Lasers and Applications VIII
KEYWORDS: Chemical species, Luminescence, Photons, X-rays, Electrons, Extreme ultraviolet, Free electron lasers, Liquid crystal lasers, Fusion energy, Absorption

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Multilayers, X-ray optics, Optical microscopy, Optical coatings, Reflectivity, Atomic force microscopy, Transmission electron microscopy, Extreme ultraviolet, Laser damage threshold, Free electron lasers

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Mirrors, Chemical species, Spectroscopy, Copper, Ions, Silicon, Emission spectroscopy, Aluminum, Free electron lasers, Plasma

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Femtosecond phenomena, Sensors, Crystals, Silicon, Optical microscopy, Atomic force microscopy, Extreme ultraviolet, Laser damage threshold, Free electron lasers, Absorption

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Gaussian beams, Polymethylmethacrylate, Signal attenuation, Chemical species, X-rays, Surface roughness, Atomic force microscopy, Laser ablation, Solids, X-ray lasers

Showing 5 of 9 publications
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