Dr. Jaroslav Kuba
at Czech Technical Univ in Prague
SPIE Involvement:
Conference Program Committee | Author
Publications (13)

Proceedings Article | 19 May 2011
Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III
KEYWORDS: Ultrafast phenomena, Polymethylmethacrylate, Chemical species, Polymers, Molecules, Heat treatments, Solids, Extreme ultraviolet, Free electron lasers, Absorption

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Mirrors, Chemical species, Spectroscopy, Copper, Ions, Silicon, Emission spectroscopy, Aluminum, Free electron lasers, Plasma

Proceedings Article | 15 June 2007
Proc. SPIE. 6586, Damage to VUV, EUV, and X-ray Optics
KEYWORDS: Polymethylmethacrylate, Polymers, Luminescence, Crystals, Raman spectroscopy, Solids, Extreme ultraviolet, Excitons, Time resolved spectroscopy, Solar thermal energy

Proceedings Article | 18 May 2007
Proc. SPIE. 6586, Damage to VUV, EUV, and X-ray Optics
KEYWORDS: Polymethylmethacrylate, Signal attenuation, X-rays, Zinc, Atomic force microscopy, Laser ablation, Beam shaping, X-ray lasers, Free electron lasers, Plasma

Proceedings Article | 28 January 2004
Proc. SPIE. 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
KEYWORDS: Infrared cameras, Electrodes, Spectroscopy, X-rays, Plasmas, Temporal resolution, Streak cameras, Picosecond phenomena, X-ray lasers, Pulsed laser operation

Proceedings Article | 19 December 2003
Proc. SPIE. 5197, Soft X-Ray Lasers and Applications V
KEYWORDS: Electron beams, X-rays, Laser scattering, Streak cameras, Charge-coupled devices, Picosecond phenomena, X-ray detectors, Pulsed laser operation, Thomson scattering, Hard x-rays

Showing 5 of 13 publications
Conference Committee Involvement (1)
Damage to VUV, EUV & X-ray Optics
18 April 2007 | Prague, Czech Republic
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