Dr. Jason C. S. Woo Profile

Dr. Jason C. S. Woo

at Univ of California Los Angeles

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 23 May 2005 Paper

Low frequency noise in SOI transistors

Tony Tseng, J. Woo

Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.609628

KEYWORDS: Field effect transistors, CMOS technology, Analog electronics, Silicon, Resistance, Distortion, Transistors, Molybdenum, Ionization, Capacitance

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Proceedings Article | 25 September 1996 Paper

Digital CMOS active pixel image sensor for multimedia applications

Zhimin Zhou, Bedabrata Pain, Jason Woo, Eric Fossum

Proceedings Volume 2894, (1996) https://doi.org/10.1117/12.252124

KEYWORDS: Sensors, Capacitors, Image sensors, Multimedia, CMOS sensors, Analog electronics, Image resolution, Prototyping, Digital imaging, Imaging arrays

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Proceedings Article | 23 June 1994 Paper

One-micrometer, radiation-hardened complementary metal oxide semiconductor for cryogenic analog applications

Imelda Groves, George Brown, G. Pollack, K. Green, Larry Dawson, Arvind D'Souza, Chih-Chia Lin, M. Song, C. Hwang, Jason Woo, Kenneth MacWilliams

Proceedings Volume 2226, (1994) https://doi.org/10.1117/12.178494

KEYWORDS: CMOS technology, Cryogenics, Analog electronics, Silicon, Radiation effects, Dielectrics, Field effect transistors

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Proceedings Article | 16 March 1993 Paper

Rapid thermal oxidation for VLSI gate dielectrics applications

Jason Woo, James Cable

Proceedings Volume 1804, (1993) https://doi.org/10.1117/12.142081

KEYWORDS: Oxides, Dielectrics, Transistors, Nitrogen, Interfaces, Diffusion, Thermal oxidation, Very large scale integration, Laser processing, Dielectric breakdown

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Proceedings Article | 14 January 1993 Paper

Breakdown voltage of submicron MOSFETs in fully depleted SOI

Neal Kistler, Eric Ver Ploeg, Jason Woo, James Plummer

Proceedings Volume 1802, (1993) https://doi.org/10.1117/12.139352

KEYWORDS: Field effect transistors, Resistance, Transistors, Silicon, Very large scale integration, Microelectronics, Manufacturing, Reliability, Ionization, Silicon films

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Proceedings Article | 14 January 1993 Paper

Temperature dependence of hot-carrier lifetime due to trapped charge and interface state generation

Miryeong Song, Kenneth MacWilliams, Jason Woo

Proceedings Volume 1802, (1993) https://doi.org/10.1117/12.139355

KEYWORDS: Interfaces, Switches, Silicon, Aerospace engineering, Temperature metrology, Information operations, Liquids, Nitrogen, Reliability, Microelectronics

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Showing 5 of 6 publications

Proceedings Volume Editor (1)

SPIE Conference Volume | 14 January 1993

Microelectronics Manufacturing and Reliability

Conference Committee Involvement (1)

Microelectronics Manufacturing and Reliability

21 September 1992 | San Jose, CA, United States

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