Dr. Javier Marrugo
at University of Cartagena
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Fringe analysis, 3D acquisition, Imaging systems, Cameras, Calibration, Dermatology, Skin, 3D modeling, 3D metrology, Profilometers, 3D image processing, 3D imaging metrology, Medical diagnostic instruments

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