Dr. Jay Theodore Cremer
Chief Scientist at Adelphi Technology Inc
SPIE Involvement:
Publications (14)

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11108, Advances in X-Ray/EUV Optics and Components XIV
KEYWORDS: X-ray optics, Capillaries, Glasses, Photons, X-rays, Collimators, Gamma radiation, X-ray imaging, Compton scattering, Hard x-rays

Proceedings Article | 24 September 2007 Paper
Proc. SPIE. 6707, Penetrating Radiation Systems and Applications VIII
KEYWORDS: X-ray optics, Imaging systems, Lenses, Sensors, X-rays, Radiography, Tomography, X-ray imaging, Spherical lenses, X-ray detectors

Proceedings Article | 7 December 2006 Paper
Proc. SPIE. 5974, International Conference on Charged and Neutral Particles Channeling Phenomena
KEYWORDS: Confocal microscopy, Optical components, Capillaries, X-rays, Lens design, Epoxies, X-ray lasers, Spherical lenses, Free electron lasers, Absorption

Proceedings Article | 21 September 2005 Paper
Proc. SPIE. 5923, Penetrating Radiation Systems and Applications VII
KEYWORDS: Signal to noise ratio, Fiber optics, Imaging systems, Spatial frequencies, Sensors, Scintillators, Charge-coupled devices, Modulation transfer functions, CCD image sensors, Signal detection

Proceedings Article | 26 October 2004 Paper
Proc. SPIE. 5541, Penetrating Radiation Systems and Applications VI
KEYWORDS: Cadmium, Scattering, Sensors, Signal attenuation, Image resolution, Refraction, Aluminum, Spherical lenses, Phase shifts, Absorption

Showing 5 of 14 publications
Conference Committee Involvement (1)
Penetrating Radiation Systems and Applications V
7 August 2003 | San Diego, California, United States
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