Dr. Jay B. James
V.P. of Business Development at FLIR Systems Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

Proceedings Article | 30 April 2007
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: FT-IR spectroscopy, Data modeling, Calibration, Spectroscopy, Photons, Dielectrics, Black bodies, Infrared radiation, Resistors, Temperature metrology

Proceedings Article | 30 April 2007
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: Nonuniformity corrections, Human-machine interfaces, Infrared imaging, Image processing, Video, Control systems, Signal processing, Projection systems, Infrared radiation, Convolution

Proceedings Article | 30 April 2007
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: Microelectromechanical systems, Packaging, Mid-IR, Electronics, Interfaces, Analog electronics, Digital electronics, Cryogenics, Prototyping, Temperature metrology

Proceedings Article | 16 May 2006
Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
KEYWORDS: Electronics, Tungsten, Interfaces, Resistance, Control systems, Infrared radiation, Heatsinks, Semiconducting wafers, Cryogenics, Prototyping

Proceedings Article | 16 May 2006
Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
KEYWORDS: Nonuniformity corrections, Human-machine interfaces, Infrared imaging, Electronics, Image processing, Video, Control systems, Projection systems, Infrared radiation, Temperature metrology

Proceedings Article | 15 May 2006
Proc. SPIE. 6207, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII
KEYWORDS: Long wavelength infrared, Thermography, Infrared imaging, Calibration, Black bodies, Projection systems, Infrared radiation, Radiometry, Minimum resolvable temperature difference, Temperature metrology

Showing 5 of 14 publications
Conference Committee Involvement (2)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
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