Mr. Jay Jung Profile

Jay Jung

at ASML Korea Co Ltd

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 22 February 2021 Presentation + Paper

Edge placement error wafer mapping and investigation for improvement in advanced DRAM node

Kuan-Ming Chen, Wolfgang Henke, WeiTai Lin, Anita Bouma, Ji-Hoon Jung, JaeYoung Park, Jonggeun Won, Hsin-Yu Chen, Chih-Hung Hsieh, Abdalmohsen Elmalk, Taekwon Jee, Seung-Uk Jeong, Jeongwoo Jae, Sang-Woo Kim, Dongyoung Lee, Jungchan Kim, WonKwang Ma, Sang-Ho Lee, Chan-Ha Park, Ewa Kasperkiewicz, Gratiela Isai, Gwang-Gon Kim, Sotirios Tsiachris, Jae-Doug Yoo, Yuna Park, Nang-Lyeom Oh, Sudharshanan Raghunathan, Rizvi Rahman, Kuo-Feng Pao, Kyoyeon Cho

Proceedings Volume 11611, 116111V (2021) https://doi.org/10.1117/12.2584149

KEYWORDS: Semiconducting wafers, Critical dimension metrology, Overlay metrology, Optical lithography, Metrology, Visualization, Statistical analysis, Lithography, Graphic design, Etching

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Proceedings Article | 20 March 2020 Paper

On-product focus monitoring and control for immersion lithography in 3D-NAND manufacturing

Amine Lakcher, Ahmed Zayed, Jennifer Shumway, Jan-Pieter van Delft, Gratiela Isai, Ruxandra Mustata, Arno van den Brink, Taeddy Kim, Jay Jung, ChanHa Park, Gunwoong Lee, Paul Böcker, Mohamed El Kodadi, Geert Vinken, Yong-Sik Shin, Soo-Kyung Lee, Sangjun Han, Jeongsu Park, Beomki Shin

Proceedings Volume 11325, 1132521 (2020) https://doi.org/10.1117/12.2552930

KEYWORDS: Semiconducting wafers, Metrology, Scanners, Immersion lithography, Critical dimension metrology, Lithography, Lithographic process control

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