Mr. Jay Kumler
President at JENOPTIK Optical Systems LLC
SPIE Involvement:
Board of Directors | Corporate and Exhibitor Committee | Financial Advisory Committee | Fellow status | Symposium Chair | Conference Program Committee | Conference Chair | Author
Area of Expertise:
Optical Design , Projection optics , Aspheric Metrology , Precision Lens Assemblies , Hyperspectral Imaging , Opto-mechanical design
Profile Summary

President, JENOPTIK Optical Systems, LLC 2009-present
President of Coastal Optical Systems 1991-2009
President of Liebmann Optical Company 2008-2009
Director, MEMS Optical Inc (2006-2009)

President, American Precision Optics Manufacturing Association
Board Member of Board of Directors, American Precision Optics Manufacturing Association
Corporate member of the Florida Photonics Cluster
Industrial Affiliate, University of Rochester, Institute of Optics
Industrial affiliate, University of Central Florida, CREOL College of Optics and Photonics
Technical program committee for the 2010 International Optical Design Conference in Jackson Hole, WY
Author of 11 technical papers and one book chapter

South Florida Business Journal “FastTech” #4th fastest growing high tech company (2011)
South Florida 2010 Manufacturer of the Year Finalist
2014 R&D 100 Editor's Choice Award
Publications (10)

Proc. SPIE. 10377, Optical System Alignment, Tolerancing, and Verification XI
KEYWORDS: Microscopes, Diffraction, Manufacturing, Life sciences, Objectives, Optical alignment

PROCEEDINGS ARTICLE | October 11, 2015
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Zemax, Monochromatic aberrations, Optical design, Polishing, Optical spheres, Aspheric lenses, Cesium, Optics manufacturing, Magnetorheological finishing, Surface finishing

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
KEYWORDS: Mirrors, Silica, Fiber optics, Imaging systems, Scintillators, Reflectivity, Lens design, Colorimetry, Modulation transfer functions, Optics manufacturing

SPIE Conference Volume | May 9, 2011

PROCEEDINGS ARTICLE | September 14, 2007
Proc. SPIE. 6671, Optical Manufacturing and Testing VII
KEYWORDS: Mirrors, Optical design, Metrology, Interferometers, Interferometry, Aspheric optics, Aspheric lenses, Zoom lenses, Tolerancing, Surface finishing

SPIE Conference Volume | May 14, 2007

Showing 5 of 10 publications
Conference Committee Involvement (13)
SPIE Defense + Commercial Sensing
14 April 2019 | Baltimore, United States
SPIE Commercial + Scientific Sensing and Imaging
15 April 2018 | Orlando, United States
Optifab 2017
16 October 2017 | Rochester, New York, United States
Optifab 2015
12 October 2015 | Rochester, New York, United States
Optifab 2013
14 October 2013 | Rochester, New York, United States
Showing 5 of 13 published special sections
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