Jayesh M. Rathod
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 April 2020 Presentation + Paper
Proceedings Volume 11400, 1140009 (2020) https://doi.org/10.1117/12.2555032
KEYWORDS: Computer aided design, Error analysis, CCD cameras, Imaging systems, Convolution, Inspection, Data acquisition, Image processing, Calibration, Image classification

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