Dr. Jean-François Vandenrijt
at Centre Spatial de Liège
SPIE Involvement:
Author
Publications (24)

Proceedings Article | 5 September 2019 Paper
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010

Proceedings Article | 5 September 2019 Paper
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Composites, Inspection, Nondestructive evaluation, Finite element methods, Shearography

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Thermography, Principal component analysis, Statistical analysis, Data modeling, Wavelets, Denoising, Composites, Lamps, Inspection, Nondestructive evaluation, Shearography, Image deconvolution

Proceedings Article | 7 September 2018 Paper
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Optical components, Zemax, Mirrors, Interferometry, Wavefronts, Space mirrors, Finite element methods, Phase measurement

Showing 5 of 24 publications
Conference Committee Involvement (1)
Optics and Photonics for Advanced Dimensional Metrology
6 April 2020 | Online Only, France
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