Dr. Jean-Jacques Yon
at MINATEC
SPIE Involvement:
Author
Publications (42)

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10569, International Conference on Space Optics — ICSO 2000
KEYWORDS: Staring arrays, Amorphous silicon, Bolometers, Microbolometers, Signal to noise ratio, Sensors, Silicon, Reliability, Resistance, Infrared radiation

PROCEEDINGS ARTICLE | September 19, 2016
Proc. SPIE. 9974, Infrared Sensors, Devices, and Applications VI
KEYWORDS: Bolometers, Microbolometers, Infrared sensors, Resonators, Sensors, Finite element methods, Aluminum, Infrared detection, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Staring arrays, Bolometers, Packaging, Microbolometers, Thermography, Infrared sensors, Thin films, Electroluminescence, Infrared radiation, Semiconducting wafers

PROCEEDINGS ARTICLE | October 24, 2012
Proc. SPIE. 8541, Electro-Optical and Infrared Systems: Technology and Applications IX
KEYWORDS: Staring arrays, Bolometers, Packaging, Microbolometers, Infrared sensors, Thin films, Sensors, Resistance, Infrared radiation, Semiconducting wafers

PROCEEDINGS ARTICLE | October 24, 2012
Proc. SPIE. 8541, Electro-Optical and Infrared Systems: Technology and Applications IX
KEYWORDS: Staring arrays, Amorphous silicon, Readout integrated circuits, Infrared detectors, Microbolometers, Resistance, Reflectivity, Infrared radiation, Electro optics, Absorption

PROCEEDINGS ARTICLE | May 31, 2012
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Bolometers, Packaging, Microbolometers, Thermography, Infrared sensors, Infrared imaging, Resistance, Imaging devices, Measurement devices, Semiconducting wafers

Showing 5 of 42 publications
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