Jean-Luc Meunier
Senior Research Engineer at Xerox Research Ctr Europe
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 January 2008
Proc. SPIE. 6815, Document Recognition and Retrieval XV
KEYWORDS: Statistical analysis, Detection and tracking algorithms, Data modeling, Composites, Machine learning, Analytical research, Optical character recognition, Neodymium, Tolerancing, Digital libraries

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