Prof. Jean-Luc Starck
at Commissariat à l'Energie Atomique
SPIE Involvement:
Author | Instructor
Publications (40)

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11138, Wavelets and Sparsity XVIII
KEYWORDS: Signal to noise ratio, Point spread functions, Astronomy, Denoising, Image restoration, Computer simulations, Deconvolution, Galactic astronomy, Wavelet image processing

Proceedings Article | 24 August 2017 Presentation + Paper
Proc. SPIE. 10394, Wavelets and Sparsity XVII
KEYWORDS: Point spread functions, Image processing, Signal processing

SPIE Journal Paper | 5 February 2015
OE Vol. 54 Issue 03
KEYWORDS: Range imaging, Associative arrays, Sensors, Signal processing, Signal to noise ratio, Imaging systems, Pulsed laser operation, Binary data, Cameras, Signal attenuation

Proceedings Article | 2 August 2014 Paper
Proc. SPIE. 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave
KEYWORDS: Signal to noise ratio, Point spread functions, Telescopes, Stars, Space telescopes, Signal processing, Spatial resolution, Galactic astronomy, Electroluminescent displays, Talc

Proceedings Article | 26 September 2013 Paper
Proc. SPIE. 8858, Wavelets and Sparsity XV
KEYWORDS: Signal to noise ratio, Wavelets, Error analysis, Computer simulations, Inverse problems, 3D metrology, Associative arrays, Reconstruction algorithms, Galactic astronomy, Electroluminescent displays

Showing 5 of 40 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 19 December 2002

SPIE Conference Volume | 1 November 2001

Conference Committee Involvement (6)
Wavelets and Sparsity XIV
21 August 2011 | San Diego, California, United States
Wavelets XIII
2 August 2009 | San Diego, California, United States
Wavelets XII
26 August 2007 | San Diego, California, United States
Wavelets XI
31 July 2005 | San Diego, California, United States
Astronomical Data Analysis II
27 August 2002 | Waikoloa, Hawai'i, United States
Showing 5 of 6 Conference Committees
Course Instructor
SC137: Multiscale Analysis Methods in Astronomy and Engineering
Multiscale analysis methods, including wavelet transforms, used for image enhancement, faint feature recognition, image content characterization and fusion are presented in this material. Embedded applications in object detection, image database operations, image and signal compression and transmission, and process control are also discussed. This course explains how image and signal processing methods are used in science operations, product development and visual inspection.
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