Dr. Jean-Marc Baribeau Profile

Dr. Jean-Marc Baribeau

at National Research Council Canada

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 25 March 2005 Paper

Self-assembled SiGe dots

Jean-Marc Baribeau, Nelson Rowell, David Lockwood

Proceedings Volume 5732, (2005) https://doi.org/10.1117/12.573063

KEYWORDS: Germanium, Silicon, Superlattices, Diffusion, Photodetectors, Transmission electron microscopy, Annealing, Quantum dots, Semiconductors, Excitons

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Proceedings Article | 19 March 1999 Paper

Si/Si1-xGex waveguide components for WDM demultiplexing

Siegfried Janz, Dan-Xia Xu, Jean-Marc Baribeau, Andre Delage, Robin Williams

Proceedings Volume 3630, (1999) https://doi.org/10.1117/12.342798

KEYWORDS: Waveguides, Silicon, Demultiplexers, Wavelength division multiplexing, Semiconducting wafers, Germanium, Waveguide modes, Etching, Refractive index, Infrared cameras

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Proceedings Article | 4 December 1998 Paper

Optical and structural characterization of nc-Si/a-SiO2 superlattices

G. Grom, Leonid Tsybeskov, Karl Hirschman, Philippe Fauchet, Mario Zacharias, Thomas Blanton, John McCaffrey, Jean-Marc Baribeau, G. Sproule, H. Labbe, David Lockwood

Proceedings Volume 3491, (1998) https://doi.org/10.1117/12.328605

KEYWORDS: Silicon, Stereolithography, Raman spectroscopy, Crystals, Amorphous silicon, Annealing, Phonons, Laser sintering, Acoustics, Oxidation

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Proceedings Article | 25 April 1997 Paper

Fabrication of Si/Si1-xGex waveguide WDM components

Dan-Xia Xu, Siegfried Janz, Robin Williams, Elizabeth Allegretto, Sylvain Mailhot, Jian Jun He, Jean-Marc Baribeau, Hugues Lafontaine, John Stapledon, Jeffrey Fraser, Mike Robillard, Paul Jessop, Stephen Kovacic

Proceedings Volume 3007, (1997) https://doi.org/10.1117/12.273852

KEYWORDS: Waveguides, Silicon, Germanium, Refractive index, Wavelength division multiplexing, Waveguide modes, Chemical vapor deposition, Semiconducting wafers, Scanning electron microscopy, Dielectrics

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Proceedings Article | 1 August 1990 Paper

Optical transitions in Si:Ge monolayer superlattices from derivative ellipsometry spectra

Christopher Pickering, Derek Houghton, Jean-Marc Baribeau

Proceedings Volume 1286, (1990) https://doi.org/10.1117/12.20875

KEYWORDS: Stereolithography, Silicon, Superlattices, Modulation, Interfaces, Germanium, Dielectrics, Spectroscopy, Reflection, Ellipsometry

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