Dr. Jean-Marc Nivet
Engineer at Univ Stuttgart
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 September 2004 Paper
Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.544251
KEYWORDS: Calibration, 3D metrology, 3D acquisition, CCD cameras, Ronchi rulings, Distortion, Mathematical modeling, Clouds, Signal processing, Imaging systems

Proceedings Article | 30 May 2003 Paper
Jean-Marc Nivet, Klaus Koerner, Ulrich Droste, Matthias Fleischer, Hans Tiziani, Wolfgang Osten
Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500071
KEYWORDS: Calibration, 3D metrology, Sensors, Modulation, Distortion, Cameras, Clouds, CCD cameras, Phase shift keying, Profiling

Proceedings Article | 30 May 2003 Paper
Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.499646
KEYWORDS: LCDs, Ronchi rulings, Light emitting diodes, Time metrology, Cameras, Digital micromirror devices, Liquid crystals, Objectives, Modulation, Liquid crystal on silicon

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