Dr. Jean-Marc Nivet
Engineer at Univ Stuttgart
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Mathematical modeling, 3D acquisition, Imaging systems, Calibration, Distortion, Clouds, CCD cameras, Signal processing, 3D metrology, Ronchi rulings

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Light emitting diodes, Modulation, Cameras, Time metrology, Liquid crystal on silicon, LCDs, Objectives, Ronchi rulings, Liquid crystals, Digital micromirror devices

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Modulation, Cameras, Sensors, Calibration, Phase shift keying, Distortion, Clouds, CCD cameras, Profiling, 3D metrology

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