Dr. Jean-Pierre Chatard Profile

Dr. Jean-Pierre Chatard

Managing Director at LYNRED

SPIE Involvement:

Author

Publications (36)

Proceedings Article | 3 April 2018 Open Access

Long linear MWIR and LWIR HgCdTe infrared detection arrays for high resolution imaging

Jean-Paul Chamonal, Patrick Audebert, Philippe Medina, Gérard Destefanis, Joel Deschamps, Michel Girard, Jean-Pierre Chatard

Proceedings Volume 10570, 105701X (2018) https://doi.org/10.1117/12.2326584

KEYWORDS: Sensors, Mercury cadmium telluride, Staring arrays, Silicon, Long wavelength infrared, Manufacturing, Detector arrays, Mid-IR, Infrared detection, Image resolution

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Proceedings Article | 31 May 2005 Paper

35 µm pitch at ULIS, a breakthrough

C. Trouilleau, A. Crastes, O. Legras, J. Tissot, J. Chatard

Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.605336

KEYWORDS: Sensors, Staring arrays, Amorphous silicon, Bolometers, Readout integrated circuits, Microbolometers, Manufacturing, Video, Clocks, Silicon

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Proceedings Article | 10 January 2005 Paper

High-performance and low-thermal time constant amorphous silicon-based 320 x 240 uncooled microbolometer IRFPA

Jean-Luc Tissot, Jean-Pierre Chatard, Bruno Fieque, Olivier Legras

Proceedings Volume 5640, (2005) https://doi.org/10.1117/12.579876

KEYWORDS: Readout integrated circuits, Thermography, Sensors, Amorphous silicon, Microbolometers, Staring arrays, Infrared radiation, Silicon, Manufacturing, Electro optics

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Proceedings Article | 19 February 2004 Paper

320x240 uncooled microbolometer 2D array for radiometric and process control applications

Bruno Fieque, Arnaud Crastes, Jean-Luc Tissot, Jean-Pierre Chatard, Sebastien Tinnes

Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.515961

KEYWORDS: Temperature metrology, Sensors, Microbolometers, Thermography, Process control, Infrared radiation, Standards development, Detector development, Staring arrays, Infrared imaging

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Proceedings Article | 19 February 2004 Paper

Low-cost amorphous silicon-based 160x120 uncooled microbolometer 2D array for high-volume applications

Cyrille Trouilleau, Arnaud Crastes, Jean-Luc Tissot, Jean-Pierre Chatard, Jean-Jacques Yon, Astrid Astier

Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.515958

KEYWORDS: Amorphous silicon, Readout integrated circuits, Microbolometers, Sensors, Temperature metrology, Silicon, Manufacturing, Video, Thermography, Staring arrays

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Proceedings Article | 10 October 2003 Paper

Low-cost amorphous-silicon-based 160x120 uncooled microbolometer 2D array for high-volume applications

Jean-Luc Tissot, Astrid Astier, Jean-Pierre Chatard, Sebastien Tinnes, Cyrille Trouilleau, Jean-Jacques Yon

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.488383

KEYWORDS: Amorphous silicon, Microbolometers, Thermography, Sensors, Infrared imaging, Infrared radiation, Staring arrays, Electro optics, Manufacturing, Video

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Proceedings Article | 10 October 2003 Paper

320x240 uncooled microbolometer 2D array for radiometric and process control applications

Jean-Luc Tissot, Jean-Pierre Chatard, Sebastien Tinnes, Bruno Fieque

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.488385

KEYWORDS: Temperature metrology, Sensors, Microbolometers, Thermography, Standards development, Process control, Infrared radiation, Detector development, Infrared imaging, Manufacturing

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Proceedings Article | 23 January 2003 Paper

Technical trends in amorphous-silicon-based uncooled IR focal plane arrays

Jean-Luc Tissot, Jean-Pierre Chatard, Eric Mottin

Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.453842

KEYWORDS: Microbolometers, Amorphous silicon, Staring arrays, Sensors, Standards development, Packaging, Manufacturing, Silicon, Semiconducting wafers, Video

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Proceedings Article | 5 August 2002 Paper

Uncooled amorphous-silicon technology: high-performance achievement and future trends

Eric Mottin, Astrid Bain, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Jean-Jacques Yon, Jean-Pierre Chatard, Jean-Luc Tissot

Proceedings Volume 4721, (2002) https://doi.org/10.1117/12.478861

KEYWORDS: Sensors, Amorphous silicon, Standards development, Electrodes, Microbolometers, Resistance, Infrared sensors, Staring arrays, Infrared imaging, Silicon

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Proceedings Article | 21 May 2002 Paper

Amorphous silicon technology improvement at CEA-LETI

Eric Mottin, Astrid Bain, Pierre Castelein, Jean-Louis Ouvrier-Buffet, Jean-Luc Tissot, Jean-Jacques Yon, Jean-Pierre Chatard

Proceedings Volume 4650, (2002) https://doi.org/10.1117/12.467656

KEYWORDS: Sensors, Amorphous silicon, Resistance, Microbolometers, Bolometers, Standards development, Infrared sensors, Infrared radiation, Silicon, Electrodes

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Proceedings Article | 10 October 2001 Paper

Enhanced amorphous silicon technology for 320 x 240 microbolometer arrays with a pitch of 35 um

Eric Mottin, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Michel Vilain, Astrid Bain, Jean-Jacques Yon, Jean-Luc Tissot, Jean-Pierre Chatard

Proceedings Volume 4369, (2001) https://doi.org/10.1117/12.445293

KEYWORDS: Amorphous silicon, Microbolometers, Sensors, Packaging, Standards development, Silicon, Semiconducting wafers, Signal to noise ratio, Bolometers, Etching

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Proceedings Article | 12 June 2001 Paper

Uncooled infrared detector technology from research to production within six months

Jean-Pierre Chatard, Philippe Tribolet

Proceedings Volume 4288, (2001) https://doi.org/10.1117/12.429398

KEYWORDS: Microbolometers, Sensors, Infrared detectors, Resistance, Amorphous silicon, CMOS technology, Detector development, Manufacturing, Silicon, Bolometers

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Proceedings Article | 15 December 2000 Paper

From research to production: 10 years of success

Philippe Tribolet, Jean-Pierre Chatard

Proceedings Volume 4130, (2000) https://doi.org/10.1117/12.409884

KEYWORDS: Sensors, Mercury cadmium telluride, Semiconducting wafers, Infrared sensors, Silicon, Staring arrays, Manufacturing, Infrared detectors, Quantum well infrared photodetectors, Microbolometers

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Proceedings Article | 15 December 2000 Paper

Long linear MWIR and LWIR HgCdTe arrays for high-resolution imaging

Jean-Paul Chamonal, Eric Mottin, Patrick Audebert, Michel Ravetto, Marcel Caes, Jean-Pierre Chatard

Proceedings Volume 4130, (2000) https://doi.org/10.1117/12.409886

KEYWORDS: Sensors, Mercury cadmium telluride, Staring arrays, Silicon, Prototyping, CMOS sensors, Imaging arrays, Mid-IR, Infrared imaging, Sensor performance

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Proceedings Article | 15 December 2000 Paper

320 x 240 microbolometer uncooled IRFPA development

Jean-Luc Tissot, Jean-Luc Martin, Eric Mottin, Michel Vilain, Jean-Jacques Yon, Jean-Pierre Chatard

Proceedings Volume 4130, (2000) https://doi.org/10.1117/12.409888

KEYWORDS: Microbolometers, Amorphous silicon, Reliability, Sensors, Standards development, Bolometers, Silicon, Packaging, Electro optics, Staring arrays

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Proceedings Article | 17 July 2000 Paper

High-performance infrared detectors at Sofradir

Philippe Tribolet, Philippe Chorier, Alain Manissadjian, Patricia Costa, Jean-Pierre Chatard

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391759

KEYWORDS: Sensors, Staring arrays, Mercury cadmium telluride, Modulation transfer functions, Sensor performance, Mid-IR, Long wavelength infrared, Diodes, Infrared detectors, Spatial resolution

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Proceedings Article | 17 July 2000 Paper

320x240 microblometer uncooled IRFPA

Eric Mottin, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Michel Vilain, Jean-Jacques Yon, Jean-Pierre Chatard

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391765

KEYWORDS: Amorphous silicon, Microbolometers, Reliability, Sensors, Bolometers, Resistance, Silicon, Electro optics, Standards development, Staring arrays

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Proceedings Article | 26 July 1999 Paper

LW MCT IRFPA cost optimization

Jean-Pierre Chatard

Proceedings Volume 3698, (1999) https://doi.org/10.1117/12.354542

KEYWORDS: Semiconducting wafers, Sensors, Staring arrays, Silicon, Chlorine, Manufacturing, Photovoltaics, Statistical analysis, Infrared radiation, Reliability

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Proceedings Article | 11 August 1998 Paper

SOFRADIR IR detectors today and tomorrow

Jean-Pierre Chatard, Philippe Tribolet

Proceedings Volume 3553, (1998) https://doi.org/10.1117/12.318093

KEYWORDS: Staring arrays, Sensors, Semiconducting wafers, Silicon, Photovoltaics, Manufacturing, Infrared detectors, Mercury cadmium telluride, Quantum well infrared photodetectors, Diodes

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Proceedings Article | 11 August 1998 Paper

Long linear MWIR and LWIR HgCdTe infrared detection arrays for high-resolution imaging

Jean-Paul Chamonal, Patrick Audebert, Philippe Medina, Gerard Destefanis, Joel Deschamps, Michel Girard, Jean-Pierre Chatard

Proceedings Volume 3553, (1998) https://doi.org/10.1117/12.318092

KEYWORDS: Sensors, Mercury cadmium telluride, Detector arrays, Silicon, Staring arrays, Mid-IR, Long wavelength infrared, CMOS sensors, Manufacturing, Imaging arrays

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Proceedings Article | 22 June 1998 Paper

Sofradir IR detectors: today and tomorrow

Jean-Pierre Chatard

Proceedings Volume 3419, 34190V (1998) https://doi.org/10.1117/12.311015

KEYWORDS: Infrared detectors, Staring arrays, Medium wave

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Proceedings Article | 31 December 1997 Paper

1500-element linear MWIR and LWIR HgCdTe arrays for high-resolution imaging

Jean-Paul Chamonal, Eric Mottin, Patrick Audebert, Philippe Medina, Michel Ravetto, Joel Deschamps, Michel Girard, Jean-Pierre Chatard

Proceedings Volume 3221, (1997) https://doi.org/10.1117/12.298106

KEYWORDS: Imaging arrays, Mercury cadmium telluride, Sensors, Mid-IR, Long wavelength infrared, Infrared imaging, Infrared sensors, Image resolution, Imaging systems, Sensor performance

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Proceedings Article | 23 October 1997 Paper

1500-element linear MWIR and LWIR HgCdTe arrays for high-resolution imaging

Jean-Paul Chamonal, Eric Mottin, Patrick Audebert, Philippe Medina, Michel Ravetto, Joel Deschamps, Michel Girard, Jean-Pierre Chatard

Proceedings Volume 3122, (1997) https://doi.org/10.1117/12.292701

KEYWORDS: Sensors, Mercury cadmium telluride, Staring arrays, Detector arrays, Capacitors, CMOS sensors, Silicon, Long wavelength infrared, Mid-IR, Sensor performance

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Proceedings Article | 13 August 1997 Paper

Long-MWIR HgCdTe butted linear arrays

Jean-Paul Chamonal, Patrick Audebert, Gerard Destefanis, Philippe Medina, Michel Ravetto, Joel Deschamps, Michel Girard, Jean-Pierre Chatard

Proceedings Volume 3061, (1997) https://doi.org/10.1117/12.280365

KEYWORDS: Sensors, Mercury cadmium telluride, Detector arrays, Silicon, Staring arrays, CMOS sensors, Mid-IR, Sensor performance, Reliability, Infrared imaging

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Proceedings Article | 17 June 1996 Paper

Detector Dewar cooler assemblies trade-off with equipment needs: a key issue for cost reduction

Jean-Pierre Chatard

Proceedings Volume 2746, (1996) https://doi.org/10.1117/12.243045

KEYWORDS: Staring arrays, Sensors, Infrared detectors, Infrared radiation, Infrared sensors, Infrared technology, Mercury cadmium telluride, Manufacturing, Charge-coupled devices, Assembly equipment

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Proceedings Article | 8 September 1995 Paper

SOFRADIR MCT IRFPA: new developments

Jean-Pierre Chatard

Proceedings Volume 2552, (1995) https://doi.org/10.1117/12.218276

KEYWORDS: Staring arrays, Diodes, Photovoltaics, Infrared detectors, Infrared technology, Silicon, Medium wave, Reliability, Sensors, Infrared radiation

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Proceedings Article | 17 October 1994 Paper

Development and demonstration of the SOFRADIR 480 x 4 infrared FPA for the LOSAT second-generation FLIR

James Kraus, James Dietz, Jean-Pierre Chatard, Philippe Tribolet, Suzanne Daniels, Sam Wood

Proceedings Volume 2269, (1994) https://doi.org/10.1117/12.188666

KEYWORDS: Infrared radiation, Staring arrays, Sensors, Forward looking infrared, Thermography, Missiles, Infrared technology, Infrared detectors, Charge-coupled devices, Prototyping

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Proceedings Article | 17 October 1994 Paper

Use of 2-D cadmium mercury teluride (CMT) IRFPA for seeker applications

Francis Bertrand, Philippe Riviere, Pascal Migaud, Jean-Pierre Chatard

Proceedings Volume 2269, (1994) https://doi.org/10.1117/12.188663

KEYWORDS: Sensors, Infrared technology, Temperature metrology, Electronics, Calibration, Target recognition, Cadmium, Analog electronics, Infrared sensors, Missiles

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Proceedings Article | 17 October 1994 Paper

SOFRADIR second-generation IRFPA technology: recent developments

Jean-Pierre Chatard

Proceedings Volume 2269, (1994) https://doi.org/10.1117/12.188658

KEYWORDS: Staring arrays, Infrared technology, Photovoltaics, Silicon, Infrared radiation, Signal processing, Sensors, Indium, Diodes, Charge-coupled devices

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Proceedings Article | 17 October 1994 Paper

SOFRADIR detector dewar cooler assemblies evolution to fulfill new market requirements

Jean-Pierre Chatard

Proceedings Volume 2269, (1994) https://doi.org/10.1117/12.188659

KEYWORDS: Sensors, Staring arrays, Ceramics, Cooling systems, Detector development, Infrared technology, Infrared sensors, Thermoelectric materials, Cryogenics, Temperature metrology

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Proceedings Article | 15 July 1994 Paper

General analysis of infrared focal plane array performance versus focal plane array operating temperature, number of TDI elements, diode area and cut-off wavelength

Jean-Pierre Chatard, Philippe Tribolet, Patricia Costa

Proceedings Volume 2225, (1994) https://doi.org/10.1117/12.179717

KEYWORDS: Staring arrays, Diodes, Infrared radiation, Infrared imaging, Surveillance, Manufacturing, Mercury cadmium telluride, Detector arrays, Electro optics, Thermography

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Proceedings Article | 10 December 1992 Paper

SOFRADIR IRFPA technology

Jean-Pierre Chatard, Louis-Pascal Angebault, Philippe Tribolet

Proceedings Volume 1735, (1992) https://doi.org/10.1117/12.138641

KEYWORDS: Infrared detectors, Staring arrays, Standards development, Sensors, Infrared radiation, Charge-coupled devices, Infrared sensors, Liquid phase epitaxy, Manufacturing, Silicon

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Proceedings Article | 12 August 1992 Paper

Analysis of criteria selection for IRFPA detector production

Jean-Pierre Chatard, Daniel Zenatti

Proceedings Volume 1683, (1992) https://doi.org/10.1117/12.137781

KEYWORDS: Staring arrays, Sensors, Semiconducting wafers, Charge-coupled devices, Liquid phase epitaxy, Manufacturing, Photovoltaics, Diodes, Silicon, Ion implantation

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Proceedings Article | 1 November 1990 Paper

SOFRADIR IR focal plane array production

Jean-Pierre Chatard

Proceedings Volume 1341, (1990) https://doi.org/10.1117/12.23106

KEYWORDS: Staring arrays, Infrared technology, Sensors, Manufacturing, Photovoltaics, Silicon, Infrared radiation, Indium, Charge-coupled devices, Manufacturing equipment

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Proceedings Article | 1 November 1990 Paper

System design of a long-wavelength IR CCD camera based on a 240X4 MCT focal plane array

Thomas Briere, R. Hohenberger, Jean-Pierre Chatard

Proceedings Volume 1341, (1990) https://doi.org/10.1117/12.23123

KEYWORDS: Sensors, Staring arrays, Telescopes, Infrared cameras, Multiplexing, Imaging systems, Video, Charge-coupled devices, Simulation of CCA and DLA aggregates, Cryogenics

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Proceedings Article | 1 November 1990 Paper

Applications of infrared bidimensional devices in astronomy

Jean-Louis Monin, Marcel Caes, Jean-Pierre Chatard, Pierre Nicolas, Raymond Boch

Proceedings Volume 1341, (1990) https://doi.org/10.1117/12.23093

KEYWORDS: Sensors, Infrared radiation, Astronomy, Near infrared, Charge-coupled devices, Thermography, Infrared sensors, Radon, Infrared technology, Information operations

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