Dr. Jed Khoury
Research Physist at Lartec Inc
SPIE Involvement:
Fellow status | Senior status | Conference Program Committee | Author
Publications (93)

Proceedings Article | 13 May 2019
Proc. SPIE. 10995, Pattern Recognition and Tracking XXX
KEYWORDS: Digital holography, Fourier transforms, Computer generated holography, Joint transforms, Optical correlators, 3D image processing

Proceedings Article | 30 April 2018
Proc. SPIE. 10649, Pattern Recognition and Tracking XXIX
KEYWORDS: Phase conjugation, Mirrors, Holography, Modulation, Spatial filters, Linear filtering, Heterodyning, Bessel functions, Filtering (signal processing), Bandpass filters

Proceedings Article | 30 April 2018
Proc. SPIE. 10649, Pattern Recognition and Tracking XXIX
KEYWORDS: Point spread functions, Holograms, Holography, Image processing, Crystals, Fourier transforms, Nondestructive evaluation, Thermal effects, Image filtering, Deconvolution

Proceedings Article | 1 May 2017
Proc. SPIE. 10203, Pattern Recognition and Tracking XXVIII
KEYWORDS: Beam splitters, Logic, Interferometers, Interferometry, Computer programming, Logic devices, Analog electronics, Optical logic, Fuzzy logic, Michelson interferometers

Proceedings Article | 1 May 2017
Proc. SPIE. 10203, Pattern Recognition and Tracking XXVIII
KEYWORDS: Phase conjugation, Mirrors, Beam splitters, Interferometers, Crystals, Nondestructive evaluation, Optical logic, Beam propagation method, Fuzzy logic, Michelson interferometers

Proceedings Article | 20 April 2016
Proc. SPIE. 9845, Optical Pattern Recognition XXVII
KEYWORDS: Optical filters, Spatial frequencies, Spatial filters, Fourier transforms, Linear filtering, Heterodyning, Homodyne detection, Tunable filters, Four wave mixing, Electronic filtering, Contrast transfer function, Bessel functions, Bandpass filters

Showing 5 of 93 publications
Conference Committee Involvement (6)
Pattern Recognition and Tracking XXXI
26 April 2020 | Anaheim, California, United States
Pattern Recognition and Tracking XXX
15 April 2019 | Baltimore, Maryland, United States
Pattern Recognition and Tracking XXIX
18 April 2018 | Orlando, Florida, United States
Pattern Recognition and Tracking XXVIII
12 April 2017 | Anaheim, California, United States
Optical Pattern Recognition XXVII
20 April 2016 | Baltimore, Maryland, United States
Showing 5 of 6 published special sections
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