Dr. Jeffery R. Price
Research & Development Staff at Aldis, Inc.
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (20)

PROCEEDINGS ARTICLE | April 3, 2008
Proc. SPIE. 6913, Medical Imaging 2008: Physics of Medical Imaging
KEYWORDS: Veins, Tissues, Scattering, Blood, Skin, 3D modeling, Monte Carlo methods, Photon transport, 3D image processing, Absorption

PROCEEDINGS ARTICLE | May 29, 2007
Proc. SPIE. 6356, Eighth International Conference on Quality Control by Artificial Vision
KEYWORDS: Microelectromechanical systems, Semiconductors, Holograms, Metrology, Inspection, Interferometry, Wavefronts, Photomasks, Phase measurement, Semiconducting wafers

PROCEEDINGS ARTICLE | March 21, 2007
Proc. SPIE. 6509, Medical Imaging 2007: Visualization and Image-Guided Procedures
KEYWORDS: Near infrared, Light emitting diodes, Principal component analysis, Veins, Imaging systems, Cameras, Calibration, Skin, Reflectivity, 3D modeling

PROCEEDINGS ARTICLE | March 5, 2007
Proc. SPIE. 6512, Medical Imaging 2007: Image Processing
KEYWORDS: Lithium, X-ray computed tomography, Data modeling, Blood, Image segmentation, Image processing, 3D modeling, Spleen, 3D image processing, Animal model studies

PROCEEDINGS ARTICLE | February 17, 2007
Proc. SPIE. 6503, Machine Vision Applications in Industrial Inspection XV
KEYWORDS: Metrology, Statistical analysis, Particles, Interfaces, Fourier transforms, Image resolution, Image analysis, Digital imaging, Silicon carbide, Lead

PROCEEDINGS ARTICLE | March 10, 2006
Proc. SPIE. 6141, Medical Imaging 2006: Visualization, Image-Guided Procedures, and Display
KEYWORDS: Near infrared, Light emitting diodes, Veins, 3D acquisition, Cameras, Image processing, Skin, 3D modeling, 3D image processing, Structured light

Showing 5 of 20 publications
Conference Committee Involvement (12)
Image Processing: Machine Vision Applications VI
5 February 2013 | Burlingame, California, United States
Image Processing: Machine Vision Applications V
25 January 2012 | Burlingame, California, United States
10th International Conference on Quality Control by Artificial Vision
28 June 2011 | Saint-Etienne, France
Image Processing: Machine Vision Applications IV
25 January 2011 | San Francisco Airport, California, United States
Image Processing: Machine Vision Applications III
20 January 2010 | San Jose, California, United States
Showing 5 of 12 published special sections
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