Dr. Jeffrey L. Guttman
Technology Director at Ophir a division of MKS Instruments
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 18 March 2016
Proc. SPIE. 9741, High-Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications V
KEYWORDS: Diagnostics, High power lasers, Sensors, Signal to noise ratio, Near infrared, Silicon, Cameras, Imaging systems, Optical testing, Laser cutting, Laser scattering, Head, Light scattering

Proceedings Article | 5 March 2008
Proc. SPIE. 6871, Solid State Lasers XVII: Technology and Devices
KEYWORDS: Laser beam propagation, Optical testing, Beam propagation method, CCD cameras, Cameras, Pulsed laser operation, Semiconductor lasers, Solid state lasers, Wave propagation, Nd:YAG lasers

Proceedings Article | 30 May 2003
Proc. SPIE. 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
KEYWORDS: Near field, Cameras, Vertical cavity surface emitting lasers, Semiconductor lasers, Fourier transforms, CCD cameras, Radiometry, Diffraction, Optical fibers, Phase retrieval

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