Jeffrey A. McCausland
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2019
Proc. SPIE. 11371, International Workshop on Thin Films for Electronics, Electro-Optics, Energy, and Sensors 2019
KEYWORDS: Carbon, Thin films, Graphene, Chemical species, Capillaries, Surface roughness, Chemical vapor deposition, Atomic force microscopy, Humidity, Fluorine

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